Archer staff operating electron-beam lithography instrumentation for device fabrication.
Archer staff inspecting silicon wafer that is used as a substrate for chip device fabrication.
Visual inspection of patterned silicon wafer.
Sample holder stage of atomic-force microscope, used for metrology and process control.
Thin-film metal deposition tool used for patterning contacts and control gates on device chips.
Archer staff loading wafer into metal deposition tool.
Archer staff and RPF technical staff operating metal deposition tool.
External LED lamp to illuminate samples inside a vacuum system.
"Unknown" was Archer's official description of this photo.
Temperature controllers for wafer processing tool.
Control unit of automated spin coater to deposit lithography resist on device wafers.
Storage box containing several 4 in silicon wafers, which are the base material for chip device fabrication.